Building layout instrument

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Description

FIG. 1 is a top plan view of a building layout instrument showing my new design, the bottom plan view being a mirror image thereof; and

FIG. 2 is a front edge elevational view, the rear edge being identical thereto.

Referenced Cited
U.S. Patent Documents
D200595 March 1965 Wendt et al.
D235521 June 1975 Donnelly
1087326 February 1914 Seehase et al.
Patent History
Patent number: D253462
Type: Grant
Filed: Nov 17, 1977
Date of Patent: Nov 20, 1979
Inventor: A. Frank Packard (Nineveh, IN)
Primary Examiner: Melvin B. Feifer
Assistant Examiner: George P. Word
Attorney: Harold R. Woodard
Application Number: 5/852,310
Classifications
Current U.S. Class: Template Or Comparator Gauge (6) (D10/64); Stencil (D19/40)
International Classification: D1906;