Micrometer

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Description

FIG. 1 is a front elevational view of a micrometer showing my new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a top plan view thereof.

Referenced Cited
U.S. Patent Documents
1703736 February 1929 Jacob
3176401 April 1965 Costantino
3608201 September 1971 Butsch
Patent History
Patent number: D254655
Type: Grant
Filed: Sep 1, 1977
Date of Patent: Apr 8, 1980
Assignee: James Neill Holdings Limited (Sheffield)
Inventor: David Brickwood (London)
Primary Examiner: Nelson C. Holtje
Attorney: Robert A. Cesari
Application Number: 5/829,988
Classifications
Current U.S. Class: Micrometer, Caliper Or Divider Type (D10/73)
International Classification: D1004;