Ultrasonic wave thickness meter

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Description

FIG. 1 is a front elevational view of an ultrasonic wave thickness meter showing our new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top plan view thereof; and

FIG. 6 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D189849 March 1961 Koch
D213962 April 1969 Potruch
D246956 January 17, 1978 Perry
D248734 August 1, 1978 Husseri
Other references
  • Krautkramer-Brochure-2/76-D-Meter Wall Thickness Gauge. Metrifast-Flyer-5/24/77-Metal Detector. Product Engineering-10/78-p. 106-Thickness Gauge at top left.
Patent History
Patent number: D254778
Type: Grant
Filed: Jan 5, 1978
Date of Patent: Apr 22, 1980
Assignee: Tokyo Keiki Company Limited (Tokyo)
Inventors: Toyohiko Kitada (Sagamihara), Kunio Iiyama (Yokohama), Kazuyuki Ito (Yokohama), Minoru Tamura (Chigasaki), Takanori Arioka (Tokyo)
Primary Examiner: Nelson C. Holtje
Law Firm: Haseltine, Lake & Waters
Application Number: 5/867,172
Classifications
Current U.S. Class: Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46); Provided With Handle, Or Hand-held (D10/78)
International Classification: D1004;