X-Ray inspection cabinet

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Description

FIG. 1 is a front perspective view of an x-ray inspection cabinet showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a right-side elevational view of a modified embodiment thereof;

FIG. 4 is a rear elevational view thereof; and

FIG. 5 is a right-side elevational view thereof.

Referenced Cited
U.S. Patent Documents
D187759 April 1960 Simmonds
D223299 April 1972 Constantine
D234227 January 1975 Muffoletto
D244059 April 12, 1977 De Lucia et al.
D254868 April 29, 1980 Hoadley
3478453 November 1969 Brodsky
4004360 January 25, 1977 Hammond
4118654 October 3, 1978 Ohta et al.
Patent History
Patent number: D270181
Type: Grant
Filed: Oct 27, 1980
Date of Patent: Aug 16, 1983
Assignee: North American Philips Corporation (New York, NY)
Inventor: David J. Haas (Suffern, NY)
Primary Examiner: Bernard Ansher
Attorney: Paul R. Miller
Application Number: 6/200,803
Classifications
Current U.S. Class: D24/02; D24/11
International Classification: D2401;