Patents Represented by Attorney, Agent or Law Firm Paul R. Miller
  • Patent number: 6241045
    Abstract: A novel fall protection apparatus is described wherein a worker can climb a pole, while maneuvering about the pole as he climbs. This structure enables the worker to both ascend and descend, but be protected upon an accidental fall from the pole. In particular, the arrangement prevents the worker from falling more than a couple of feet, and at the same time holds the worker away from the pole by an amount sufficient to prevent injuries caused by banging into the pole. This structure is especially beneficial in training new workers to climb poles for work, as well as requalifying previously trained workers.
    Type: Grant
    Filed: November 12, 1999
    Date of Patent: June 5, 2001
    Inventors: Robert E. Reeve, Steven E. Reeve
  • Patent number: 5515414
    Abstract: An X-ray diffraction device comprises a water-cooled X-ray tube which exhibits a line focus as well as, after rotation through, a point focus. Contrary to customary X-ray tubes, the cooling water is not supplied via the housing (12) in which the X-ray tube is mounted, but the cooling water connections (52, 54) are provided directly on the X-ray tube at the same side of the robe where the high-voltage connector (16) is provided. As a result, rotation of the robe upon changing over from a line focus to a point focus is not hampered by cooling water connections inside the housing of the tube. An additional advantage of this method of supplying the cooling water resides in the fact that the robe base (56) can also be cooled via these ducts. The base would otherwise become inadmissibly hot due to the loss heat from the filament (60).
    Type: Grant
    Filed: July 1, 1994
    Date of Patent: May 7, 1996
    Assignee: U.S. Philips Corporation
    Inventors: Johannes F. M. d'Achard Van Enschut, Theodorus J. J. M. Jenneskens
  • Patent number: 5510617
    Abstract: A primary beam in a scanning electron microscope (SEM) releases secondary electrons in the specimen to be studied. These electrons move back to the focusing lens against the direction of the primary beam, detection of these electrons taking place in the vicinity of said lens. A known detector comprises a Wien filter for deflecting the electrons from the optical axis to the actual detector. In accordance with the invention a SEM detector is provided with a double electric dipole. The latter leaves the primary beam undisturbed to a high degree, but very efficiently deflects the secondary electrons to the actual detector.
    Type: Grant
    Filed: March 15, 1995
    Date of Patent: April 23, 1996
    Assignee: U.S. Philips Corporation
    Inventors: Kars Z. Troost, Alexander Henstra
  • Patent number: 5511062
    Abstract: An apparatus having a frame (1) carrying a turntable (3) for supporting the information carrier, which turntable is rotatable about an axis of rotation (3A), a slide (9), which is movable between two end positions, with a scanning unit, guide spindles (5, 7) and a linear motor unit (17, 19) for the slide, and an electrically energizable clamping unit (21). In the non-energized condition the clamping unit clamps the slide in any arbitrary stationary position of the slide along its path and in the energized condition it does not clamp the slide. During operation of the device a control unit at least substantially simultaneously turns on a first energizing current to the motor drive unit and a second energizing current to the clamping unit at the beginning of a displacement of the slide and at least substantially simultaneously turns off the first energizing current and the second energizing current at the end of the displacement.
    Type: Grant
    Filed: October 6, 1993
    Date of Patent: April 23, 1996
    Assignee: U.S. Philips Corporation
    Inventors: Pieter A. Schoneveld, Leo G. M. Metzemaekers, Johannes T. A. Van De Veerdonk, Robertus J. M. Verhoeven, Cornelius A. Hezemans, Petrus J. Blankers, Johannes M. M. Hensing, Cornelis M. Beijersbergen Van Henegouwen
  • Patent number: 5508528
    Abstract: An imaging apparatus and an illumination unit for use in such an apparatus are described, which unit comprises an illumination housing (LH) accommodating a radiation source (LA) and at least a reflector (RL). To prevent a decrease of the radiation power supplied by the illumination housing, this housing is provided with means (LA, SH, L.sub.29) which prevent a diffuse deposit of silicon-containing particles present in the ambient air from being formed on optical components within the illumination housing.
    Type: Grant
    Filed: November 29, 1994
    Date of Patent: April 16, 1996
    Assignee: ASM Lithography B.V.
    Inventors: Johannes C. H. Mulkens, Nicolaas C. J. A. Van Hijningen, Judocus M. D. Stoeldrayer
  • Patent number: 5506186
    Abstract: The invention relates to a method of manufacturing an optoelectronic device. An indium phosphide part of a semiconductor body is contacted either directly or indirectly through a ternary or quaternary layer by means of a zinc diffusion. In order to improve the contact resistance, after the zinc diffusion and before the application of contacts, a heat treatment of the semiconductor body is carried out in the absence of a zinc source.
    Type: Grant
    Filed: September 30, 1991
    Date of Patent: April 9, 1996
    Assignee: U.S. Philips Corporation
    Inventor: Gerardus J. Van Gurp
  • Patent number: 5504036
    Abstract: A method is provided of manufacturing a semiconductor device whereby semiconductor elements (5) and conductor tracks (14) are formed on a first side (2) of a semiconductor slice (1) which is provided with a layer of semiconductor material (4) disposed on an insulating layer (3). Then the semiconductor slice (1) is fastened with said first side (2) to a support slice (15), after which material is removed from the semiconductor slice (1) from the other, second side (17) until the insulating layer (3) has become exposed. The insulating layer (3) is provided with contact windows (18) in which conductive elements (19) are provided. This is done from the first side (2) of the semiconductor slice (1) before the latter is fastened to the support slice (15). The semiconductor elements (5) are externally contacted with a contact wire (20) via the conductive elements (19).
    Type: Grant
    Filed: May 23, 1995
    Date of Patent: April 2, 1996
    Assignee: U.S. Philips Corporation
    Inventors: Ronald Dekker, Henricus G. R. Maas, Wilhelmus T. A. J. van den Einden
  • Patent number: 5488832
    Abstract: A matched thermal expansion support system for cryogenically cooled x-ray spectrometers is described for the purpose of holding x-ray detecting crystals precisely in position throughout large temperature changes. This thermal matching is achieved by a detector holder, having an axial thermal movement characteristic, mounted on a support having an equal, but opposite, thermal movement characteristic.
    Type: Grant
    Filed: June 15, 1994
    Date of Patent: February 6, 1996
    Assignee: Philips Electronics North America Corporation
    Inventor: Brian W. Gallagher
  • Patent number: 5490013
    Abstract: The present invention is directed to compensation plates for eliminating astigmatism and coma optical aberration in optical systems. In particular, the present invention can be used in LCD projection systems to compensate for aberrations in different color channels. This enables the production of LCD systems completely free of astigmatism and/or coma.
    Type: Grant
    Filed: February 7, 1995
    Date of Patent: February 6, 1996
    Assignee: Philips Electronics North America Corporation
    Inventors: Jeffrey A. Shimizu, Peter J. Janssen
  • Patent number: 5486480
    Abstract: A programmable transistor includes impurity regions to reduce punch-through and soft-write phenomena. In order to provide a fast operation, the impurity regions are arranged with regard to one another so that parasitic capacitances at junctions of impurity regions of mutually opposite conductivity type are minimized. For these purposes, the transistor comprises a charge storage region over a channel region in a main semiconductor zone of a first conductivity type located between a source and a drain of a second conductivity type opposite to the first. A first impurity zone of the first conductivity type, substantially laterally contiguous with the drain, extends into the channel region and is more heavily doped than the main zone. The drain includes a heavily doped third impurity region and a lightly doped second impurity region that lies at least mainly between the third region and the zones.
    Type: Grant
    Filed: October 28, 1994
    Date of Patent: January 23, 1996
    Assignee: North American Philips Corporation
    Inventor: Teh-Yi J. Chen
  • Patent number: 5486485
    Abstract: A method is set forth for forming a plurality of SOI transistors in a pattern beneath planarized reflective surfaces of a reflective display. This enables the formation of information pixels useful in devices, such as reflective LCD devices. A specific technique of providing the SOI transistors is set forth.
    Type: Grant
    Filed: February 18, 1994
    Date of Patent: January 23, 1996
    Assignee: Philip Electronics North America Corporation
    Inventors: Manjin J. Kim, Satyendranath Mukherjee
  • Patent number: 5481362
    Abstract: An apparatus for projecting a mask pattern (MA) on a substrate (W) by means of a projection lens system (PL) is described, which apparatus comprises a device for aligning a mask alignment mark (M.sub.1, M.sub.2) with respect to a substrate alignment mark (P.sub.1, P.sub.2). Means (WE.sub.1, WE.sub.2) preventing phase differences due to reflections at the mask plate (MA) from occurring within the alignment beam portions received by a detection system (13, 13') are arranged in the path of selected alignment beam portions (b.sub.1, b.sub.1 ').
    Type: Grant
    Filed: May 6, 1993
    Date of Patent: January 2, 1996
    Assignee: ASM Lithography
    Inventors: Marinus A. Van Den Brink, Henk F. D. Linders, Stefan Wittekoek
  • Patent number: 5479067
    Abstract: A vacuum tube includes a ceramic element and a conductive element. A conductive connection consisting of a first layer containing silver and a filler and a second layer containing silver, gold or copper is formed between the ceramic element and the conductive element. The two above-mentioned layers are bonded together by means of diffusion bonding.
    Type: Grant
    Filed: November 1, 1993
    Date of Patent: December 26, 1995
    Assignee: U.S. Philips Corporation
    Inventors: Ronald van der Wilk, Theodorus H. M. Stevens, Josephus J. van Moorsel
  • Patent number: 5476810
    Abstract: In manufacturing an electronic device comprising a thin-film circuit having semiconductor circuit elements (TFTs T1 & T2) processing limitations for the provision of the semiconductor film (1) and regions (5 & 6) of the semiconductor circuit elements are avoided by:(i) forming at least the thin-film semiconductive body or bodies (1) for the semiconductor circuit elements on a temporary support (10), and(ii) subsequently transferring it/them to the device substrate (20), e.g of an insulating polymer material.In a method in accordance with the invention, the temporary support is a metal foil (10) having opposite front and back faces (11 & 12) which are unattached over most of their area, the thin-film semiconductive body ( 1 ) is provided on the front face ( 11 ), and at least most of the metal foil (10) is etched away by etching into the back face (12) after the thin-film semiconductive body (1) is secured to the substrate (20).
    Type: Grant
    Filed: January 4, 1995
    Date of Patent: December 19, 1995
    Assignee: U.S. Philips Corporation
    Inventor: James E. Curran
  • Patent number: 5466937
    Abstract: A method of forming an image in an electron microscope. Because of the oscillating behaviour of the phase contrast transfer function (PCTF), images made by means of an electron microscope are liable to exhibit contrast whereas the object does not exhibit such contrast. In order to counteract these deviations, it is proposed to form sub-images, each sub-image having its own defocusing of the imaging lens and each sub-image being formed with its own weighting factor, and to add said sub-images. A substantially flat variation of the PCTF is achieved by imparting an oscillating dependence as a function of the defocusing to the weighting factor. The invention offers a simple method of image reconstruction from the sub-images in that the value of the oscillating function has the same sign throughout the defocusing range. The desired image can then be obtained by addition of the sub-images on, for example a photographic film.
    Type: Grant
    Filed: September 6, 1994
    Date of Patent: November 14, 1995
    Assignee: U.S. Philips Corporation
    Inventor: Pieter Kruit
  • Patent number: 5462468
    Abstract: A cleaning system and technique for CRT electron guns is provided in which CO.sub.2 snow is utilized to clean contaminants from the electron gun. The CO.sub.2 snow and CO.sub.2 gas are directed onto the electron gun through small orifices in nozzles arranged at angular positions relative to one another and relative to the electron gun. This enables complete cleaning of the electron gun upon the rotation and movement of the electron gun relative to the two nozzles.
    Type: Grant
    Filed: December 16, 1994
    Date of Patent: October 31, 1995
    Assignee: Philips Electronics North America Corporation
    Inventors: Richard A. Bailey, John C. Midavaine
  • Patent number: 5460451
    Abstract: A pyrometer for measuring thermal radiation and emissivity for both diffusely and specularly reflecting surfaces of an object which includes, a thermal radiation detector and an optical system connected to the detector for concentrating thermal radiation originating from an object surface area on the detector, an emissivity meter connected to the optical system, the meter further comprising a radiation source supplying measuring radiation and a measuring radiation detector, an optical integrator adjacent to the object surface area arranged in the radiation path of the measuring radiation between the radiation source and the measuring radiation detector, wherein the radiation source extends through an aperture of the optical integrator and diffusely irradiates the object surface, and a shield connected to the optical integrator for preventing measuring radiation from irradiating the object surface area directly, is described.
    Type: Grant
    Filed: December 27, 1993
    Date of Patent: October 24, 1995
    Assignee: U.S. Philips Corporation
    Inventor: Sipke Wadman
  • Patent number: 5455966
    Abstract: The inner surface of a cathode ray tube is roughened by blasting the surface with a suspension which comprises radiation particles, the inner surface being irradiated in such a manner that it satisfies the inequalities 0.05 .mu.m<R.sub.a <0.5 .mu.m and R.sub.z <4 .mu.m and, preferably, 0.1 .mu.m<R.sub.a <0.2 .mu.m. The reflection at such a surface is comparable to the reflection at an etched surface. The method in accordance with the invention is safer and less harmful to the environment.
    Type: Grant
    Filed: November 18, 1993
    Date of Patent: October 3, 1995
    Assignee: U.S. Philips Corporation
    Inventors: Hermanus N. Tuin, Maarten A. van Andel, Rudolf O. M. Lobel, Johannes H. M. Damen, Marcel Niestadt
  • Patent number: 5450501
    Abstract: A scanning microscope comprises a system (2, 3, 4) for concentrating a radiation beam from a radiation source (1) to form a scanning spot on an object (5). The radiation from the scanning spot is projected by a second optical system (6, 7) onto a radiation-sensitive detection system comprising two detectors (8, 9). The signals from the detectors (8, 9) are combined into a difference signal 11 and a sum signal 13. These two signals are formed into a complex composite signal which is transferred to the frequency domain in a circuit 22 via a Fourier transform. By performing suitable filtrations on the composite signal in the frequency domain in the circuit 23, quantitative measurements can be performed on the amplitude and phase structure of the object 5. These measurements may be visualized after an inverse Fourier transform in the circuit 24 via an image-processing system 25 on an image display unit 26.
    Type: Grant
    Filed: January 5, 1993
    Date of Patent: September 12, 1995
    Assignee: U.S. Philips Corporation
    Inventor: Albert Smid
  • Patent number: 5447074
    Abstract: A strain-gauge transducer (5) comprising a substrate (10) provided with strain gauges and pressure members (11, 12) which deform the substrate (10) via transfer elements (1a, 4a) which transmit an applied force (F). The transfer elements comprise bars (1a, 1b, 4a, 4b) molded from an elastomer in a common molding operation. A material (2a, 3a) having a higher compressibility than the bars may be interposed between the bars. This material may form elastic stops (54a) provided to preclude breakage of the substrate. This results in a transducer whose sensitivity is linear for small loads and which is very insusceptible to overloading. The transducer can be used for the construction of scales or touch tablets.
    Type: Grant
    Filed: December 19, 1994
    Date of Patent: September 5, 1995
    Assignee: U.S. Philips Corporation
    Inventors: Remy Polaert, Francois Maniguet