Ultrasonic wave thickness meter

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Description

FIG. 1 is a front elevational view of an ultrasonic wave thickness meter showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top plan view thereof; and

FIG. 6 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D189849 March 1961 Koch
D193715 October 1962 Koch
D213962 April 1969 Potruch
D246956 January 17, 1978 Perry
D249475 September 19, 1978 Turner
D254778 April 22, 1980 Kitada
D255997 July 22, 1980 Maeda
D256896 September 16, 1980 Kuramoto
D264190 May 4, 1982 Muller
Foreign Patent Documents
13703 March 1978 DEX
13589 April 1978 DEX
40913 July 1977 FRX
443788 November 1976 JPX
443788 July 1977 JPX
982833 January 1979 GBX
Other references
  • Krautkamer-Brochure-2/76-"D-Meter" Wall Thickness Gauge. Metrifast-Flyer-5/24/77-Metal Detector. Product Engineering-10/78-p. 106-Thickness Gauge at top left.
Patent History
Patent number: D271568
Type: Grant
Filed: Mar 27, 1981
Date of Patent: Nov 29, 1983
Assignee: Tokyo Keiki Company Limited (Tokyo)
Inventors: Toyohiko Kitada (Sagamihara), Minoru Tamura (Chigasaki), Takanori Arioka (Tokyo)
Primary Examiner: Nelson C. Holtje
Law Firm: Fleit, Jacobson, Cohn & Price
Application Number: 6/248,545
Classifications
Current U.S. Class: Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46)
International Classification: D1004;