Automatic perimeter for eyesight examination

- Kowa Company Ltd.
Skip to: Description  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front elevational view of an automatic perimeter for eyesight examination showing our new design.

FIG. 2 is a rear elevational view thereof.

FIG. 3 is a side elevational view thereof as viewed from the left side of FIG. 1.

FIG. 4 is a side elevational view thereof as viewed from the right side of FIG. 1.

FIG. 5 is a top plan view thereof.

FIG. 6 is a bottom plan view thereof and,

FIG. 7 is a sectional view thereof taken along the line 7--7 of FIG. 3.

FIG. 8 is a front perspective view thereof.

Referenced Cited
U.S. Patent Documents
D208883 October 1967 Ostensen
4260227 April 7, 1981 Munnerlyn et al.
4679920 July 14, 1987 Takashi et al.
Patent History
Patent number: D306068
Type: Grant
Filed: Feb 28, 1986
Date of Patent: Feb 13, 1990
Assignee: Kowa Company Ltd. (Nagoya)
Inventors: Kennosuke Cyujou (Tokyo), Keijiro Jinmon (Tokyo), Takashi Hirano (Shinki)
Primary Examiner: Susan J. Lucas
Attorneys: Emmanuel J. Lobato, Robert E. Burns
Application Number: 6/840,713
Classifications
Current U.S. Class: D24/17