In-circuit tester console

- Protech, Inc.
Description

FIG. 1 is a front elevational view of the in-circuit tester console showing our new design, the rear elevational view not shown being substantially plain and unornamented;

FIG. 2 is a right side elevational view;

FIG. 3 is a bottom plan view;

FIG. 4 is a left side elevational view;

FIG. 5 is a top plan view; and

FIG. 6 is a top, front, and left side perspective view thereof.

Referenced Cited
U.S. Patent Documents
D237596 November 1975 Jack
D265561 July 27, 1982 Cottrell
D266425 October 5, 1982 Reaume
D278041 March 19, 1985 Clarke
D281234 November 5, 1985 Groetzner et al.
D285305 August 26, 1986 Liuzzo et al.
D296086 June 7, 1988 Thompson
3493863 February 1970 Girdwood
3870953 March 1975 Boatman et al.
4196386 April 1, 1980 Phelps
4769596 September 6, 1988 Faucett
4812754 March 14, 1989 Tracy et al.
Patent History
Patent number: D311698
Type: Grant
Filed: May 13, 1987
Date of Patent: Oct 30, 1990
Assignee: Protech, Inc. (San Antonio, TX)
Inventors: Royal Elmore (San Antonio, TX), Henrick Y. Krigel (San Antonio, TX)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Law Firm: Baker & Botts
Application Number: 7/50,209
Classifications
Current U.S. Class: Electrical Property (D10/75)