Rotation microtome

- Leica Instruments GmbH
Description

FIG. 1 is a front elevational view of a rotation microtome showing my new design;

FIG. 2 is a left side elevational view of FIG. 1;

FIG. 3 is a right side elevational view of FIG. 1;

FIG. 4 is a top plan view of FIG. 1; and,

FIG. 5 is a rear elevational view of FIG. 1.

The bottom of the article is substantially plain and unornamented.

Referenced Cited
U.S. Patent Documents
D96231 July 1935 Fassin
3091144 May 1963 Villalubus
3191476 June 1965 McCormick
3212379 October 1965 McCormick et al.
4317401 March 2, 1982 Disharoon
Patent History
Patent number: D326921
Type: Grant
Filed: Apr 16, 1990
Date of Patent: Jun 9, 1992
Assignee: Leica Instruments GmbH (Nussloch)
Inventor: Werner Holbl (Vienna)
Primary Examiner: Stella Reid
Law Firm: Bean, Kauffman & Spencer
Application Number: 7/509,614
Classifications