Rotation microtome
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Description
FIG. 1 is a front elevational view of a rotation microtome showing my new design;
FIG. 2 is a left side elevational view of FIG. 1;
FIG. 3 is a right side elevational view of FIG. 1;
FIG. 4 is a top plan view of FIG. 1; and,
FIG. 5 is a rear elevational view of FIG. 1.
The bottom of the article is substantially plain and unornamented.
Referenced Cited
U.S. Patent Documents
D96231 | July 1935 | Fassin |
3091144 | May 1963 | Villalubus |
3191476 | June 1965 | McCormick |
3212379 | October 1965 | McCormick et al. |
4317401 | March 2, 1982 | Disharoon |
Patent History
Patent number: D326921
Type: Grant
Filed: Apr 16, 1990
Date of Patent: Jun 9, 1992
Assignee: Leica Instruments GmbH (Nussloch)
Inventor: Werner Holbl (Vienna)
Primary Examiner: Stella Reid
Law Firm: Bean, Kauffman & Spencer
Application Number: 7/509,614
Type: Grant
Filed: Apr 16, 1990
Date of Patent: Jun 9, 1992
Assignee: Leica Instruments GmbH (Nussloch)
Inventor: Werner Holbl (Vienna)
Primary Examiner: Stella Reid
Law Firm: Bean, Kauffman & Spencer
Application Number: 7/509,614
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)