I-beam measuring device
Description
FIG. 1 is a front-perspective view of an I-beam measuring device, showing my new design;
FIG. 2 is a right-side-elevational view thereof not seen in FIG. 1; and,
FIG. 3 is a rear-elevational view thereof.
Referenced Cited
Patent History
Patent number: D335090
Type: Grant
Filed: May 6, 1991
Date of Patent: Apr 27, 1993
Inventor: Bob L. Guillen (Grand Terrace, CA)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: Francis X. LoJacono
Application Number: 7/697,290
Type: Grant
Filed: May 6, 1991
Date of Patent: Apr 27, 1993
Inventor: Bob L. Guillen (Grand Terrace, CA)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: Francis X. LoJacono
Application Number: 7/697,290
Classifications
Current U.S. Class:
Template Or Comparator Gauge (6) (D10/64)