Double ended marking instrument

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Description

FIG. 1 is a front elevational view of the double ended marking instrument showing my new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is an exploded isometric view thereof, shown for clarity of illustration.

Referenced Cited
U.S. Patent Documents
D268501 April 5, 1983 Kruckel et al.
D268935 May 10, 1983 Horntrich
D295537 May 3, 1988 Davidson et al.
D303124 August 29, 1989 Li
D306316 February 27, 1990 Shintani
3684389 August 1972 Eron et al.
4509875 April 9, 1985 Shintani
4557618 December 10, 1985 Iwata et al.
Patent History
Patent number: D336425
Type: Grant
Filed: Jun 24, 1991
Date of Patent: Jun 15, 1993
Inventor: John W. Napora, Jr. (Scranton, PA)
Primary Examiner: Bernard Ansher
Assistant Examiner: Mitchell I. Siegel
Attorney: Leon Gilden
Application Number: 7/719,564