Capacitive test probe

- Hewlett Packard
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Description

FIG. 1 is a top, front perspective view of a capacitive test probe showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a front elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a right side elevation view thereof; and,

FIG. 7 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
5075621 December 24, 1991 Hoyt
5202640 April 13, 1993 Schaaf et al.
5212992 May 25, 1993 Calhoun et al.
Patent History
Patent number: D344464
Type: Grant
Filed: Nov 25, 1992
Date of Patent: Feb 22, 1994
Assignee: Hewlett-Packard Company (Palo Alto, CA)
Inventors: Ronald K. Kerschner (Loveland, CO), Lisa M. Kent (Loveland, CO)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Application Number: 0/1,954
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80)