Bipolar probe

Description

FIG. 1 is a perspective view of a bipolar probe showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a rear elevational view thereof; and,

FIG. 7 is a front elevational view thereof.

Referenced Cited
U.S. Patent Documents
D311346 October 16, 1990 Gross
4568444 February 4, 1986 Nakamura et al.
Patent History
Patent number: D344903
Type: Grant
Filed: Nov 25, 1992
Date of Patent: Mar 8, 1994
Assignee: Surgical Technologies, Inc. (St. Louis, MO)
Inventors: Kurt W. Gampp, Jr. (Ellisville, MO), Gregg D. Scheller (Chesterfield, MO)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Law Firm: Polster, Lieder, Woodruff & Lucchesi
Application Number: 0/1,926
Classifications