Probing head for an electrical test probe

- Tektronix, Inc.
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Description

FIG. 1 is a left side elevation view of the probing head for an electrical test probe showing our new design;

FIG. 2 is a right side elevation view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevation view thereof; and,

FIG. 6 is a rear elevation view thereof.

The cord member has been broken away indicating an indeterminate length.

Referenced Cited
U.S. Patent Documents
4978921 December 18, 1990 Indiz et al.
5032787 July 16, 1991 Johnston et al.
5041781 August 20, 1991 Kawada et al.
Other references
  • Tektronix, Passive Voltage Probes, .COPYRGT.1990, p.411, provided by applicant.
Patent History
Patent number: D346122
Type: Grant
Filed: Mar 1, 1993
Date of Patent: Apr 19, 1994
Assignee: Tektronix, Inc. (Wilsonville, OR)
Inventors: Mark W. Nightingale (Washougal, WA), Jonathan E. Myers (Aloha, OR)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 0/5,282
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)