Electrical test probe

- Tektronix, Inc.
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Description

FIG. 1 is a left side elevation view of the electrical test probe showing our new design;

FIG. 2 is a right side elevation view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a rear elevation view thereof; and,

FIG. 6 is a front elevation view thereof.

Portions of the cord member have been eliminated for ease of illustration.

Referenced Cited
U.S. Patent Documents
4978921 December 18, 1990 Indig et al.
5032787 July 16, 1991 Johnston et al.
5041781 August 20, 1991 Kawada et al.
Other references
  • Tektronix, Passive Voltage Probes, .COPYRGT.1990, p. 411, provided by applicant.
Patent History
Patent number: D346338
Type: Grant
Filed: Feb 26, 1993
Date of Patent: Apr 26, 1994
Assignee: Tektronix, Inc. (Wilsonville, OR)
Inventors: Mark W. Nightingale (Washougal, WA), Jonathan E. Myers (Aloha, OR)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 0/5,220
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)