Probing head for an electrical test probe

- Tektronix, Inc.
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Description

FIG. 1 is a top, front, and left side perspective view of the probing head for an electrical test probe showing my new design;

FIG. 2 is a left side elevation view having a mirrored right side elevation view of the probing head for an electrical test probe showing my new design;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevation view thereof; and,

FIG. 6 is a rear elevation view thereof.

Referenced Cited
U.S. Patent Documents
4034293 July 5, 1977 Roch
4151465 April 24, 1979 Lenz
4491788 January 1, 1985 Zandonatti
4533864 August 6, 1985 Austin
4701702 October 20, 1987 Kruger
Patent History
Patent number: D354923
Type: Grant
Filed: Jan 31, 1994
Date of Patent: Jan 31, 1995
Assignee: Tektronix, Inc. (Wilsonville, OR)
Inventor: Mark W. Nightingale (Washougal, WA)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 0/18,212