Probing head for an electrical test probe
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Description
FIG. 1 is a top, front, and left side perspective view of the probing head for an electrical test probe showing my new design;
FIG. 2 is a left side elevation view having a mirrored right side elevation view of the probing head for an electrical test probe showing my new design;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a front elevation view thereof; and,
FIG. 6 is a rear elevation view thereof.
Referenced Cited
Patent History
Patent number: D354923
Type: Grant
Filed: Jan 31, 1994
Date of Patent: Jan 31, 1995
Assignee: Tektronix, Inc. (Wilsonville, OR)
Inventor: Mark W. Nightingale (Washougal, WA)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 0/18,212
Type: Grant
Filed: Jan 31, 1994
Date of Patent: Jan 31, 1995
Assignee: Tektronix, Inc. (Wilsonville, OR)
Inventor: Mark W. Nightingale (Washougal, WA)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 0/18,212
Classifications