Microtome

- Leica Instruments GmbH
Skip to: Description  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front, right, top perspective view of a microtome showing my new design;

FIG. 2 is a right side elevational view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a rear elevational view thereof; and,

FIG. 7 is a left side elevational view.

Referenced Cited
U.S. Patent Documents
D328793 August 18, 1992 Holbl
3204424 September 1965 McCormick et al.
3212379 October 1965 McCormick et al.
3233965 February 1966 McCormick
4548051 October 22, 1985 Moessner
4979376 December 25, 1990 Biehl et al.
Patent History
Patent number: D358895
Type: Grant
Filed: May 20, 1991
Date of Patent: May 30, 1995
Assignee: Leica Instruments GmbH (Nussloch)
Inventor: Werner Holbl (Vienna)
Primary Examiner: A. Hugo Word
Assistant Examiner: Ian Simmons
Law Firm: Bean, Kauffman & Spencer
Application Number: 7/702,672
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)