Digital current probe

Description

FIG. 1 is a front perspective view of the digital current probe of this invention;

FIG. 2 is a front plan view of FIG. 1;

FIG. 3 is a plan view of the rear of FIG. 1;

FIG. 4 is a plan view of FIG. 1 as seen from the right side of FIG. 2;

FIG. 5 is a view of the left side of FIG. 2;

FIG. 6 is a top plan view of FIG. 2; and,

FIG. 7 is a bottom plan view of FIG. 2.

Referenced Cited
U.S. Patent Documents
D332574 January 19, 1993 Chang
D345704 April 5, 1994 Shirai
4283677 August 11, 1981 Niwa
Other references
  • I.E.N.; Clamp-on multimeter; Nov. 1978; pp. 5-9.
Patent History
Patent number: D362639
Type: Grant
Filed: Jan 24, 1994
Date of Patent: Sep 26, 1995
Inventor: Daniel Arnoux (Paris)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Attorney: John L. Welch
Application Number: 0/17,865
Classifications
Current U.S. Class: Clamp-around Type (D10/79)