Stereomicroscope

- Leica Inc.
Description

FIG. 1a is a perspective view of a stereomicroscope showing our new design;

FIG. 1b is a front elevational view thereof;

FIG. 1c is a left side elevational view thereof, the right side being a mirror image of that shown;

FIG. 1d is a rear elevational view thereof; and,

FIG. 1e is a top plan view thereof.

FIG. 2a is a perspective view of a stereomicroscope showing another embodiment of our new design;

FIG. 2b is a front elevational view thereof;

FIG. 2c is a left side elevational view thereof, the right side being a mirror image of that shown;

FIG. 2d is a rear elevational view thereof; and,

FIG. 2e is a top plan view thereof.

FIG. 3a is a perspective view of a stereomicroscope showing still another embodiment of our new design;

FIG. 3b is a front elevational view thereof;

FIG. 3c is a left side elevational view thereof, the right side being a mirror image of that shown;

FIG. 3d is a rear elevational view thereof;

FIG. 3e is a top plan view thereof; and,

FIG. 3f is a bottom plan view thereof.

FIGS. 1a, 2a and 3a have been drawn on enlarged scale as compared to the remaining figures.

Referenced Cited
U.S. Patent Documents
D296904 July 26, 1988 Lukaszewski
D355430 February 14, 1995 Hofmann-Igl
2967456 January 1961 Maier
3572884 March 1971 Chirayath
3778131 December 1973 Wanesky
3798665 March 1974 Eloranta et al.
Foreign Patent Documents
1127611 April 1962 DEX
Patent History
Patent number: D367869
Type: Grant
Filed: Mar 15, 1994
Date of Patent: Mar 12, 1996
Assignee: Leica Inc. (Depew, NY)
Inventors: Ernest Hofmann-Igl (Davos-Platz), Werner Holbl (Vienna)
Primary Examiner: Louis S. Zarfas
Assistant Examiner: Monica A. Hannon
Law Firm: Bean, Kauffman & Spencer
Application Number: 0/19,931