Rotational microtome

- Leica Instruments GmbH
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Description

FIG. 1 is a left side perspective view of a rotational microtome embodying my new design;

FIG. 2 is a right side perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a rear view thereof; and,

FIG. 7 is a top view thereof.

The bottom of the device is not visible in normal use and does not constitute part of the ornamental design.

Referenced Cited
U.S. Patent Documents
D326921 June 9, 1992 Holbl
4051755 October 4, 1977 Raveed
4700600 October 20, 1987 Pichett
5070935 December 10, 1991 Sitte et al.
Patent History
Patent number: D383548
Type: Grant
Filed: Mar 23, 1995
Date of Patent: Sep 9, 1997
Assignee: Leica Instruments GmbH (Nussloch)
Inventor: Werner Hoelbl (Vienna)
Primary Examiner: Ruth McInroy
Assistant Examiner: I. Simmons
Law Firm: Evenson, McKeown, Edwards & Lenahan P.L.L.C.
Application Number: 0/36,649
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)
International Classification: 2401;