Clamp-on current probe
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Description
FIG. 1 is a front elevational view of the clamp-on current probe according to our new design;
FIG. 2 is a bottom plan view of the clamp-on current probe of FIG. 1;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a left side elevational view thereof, as seen from the left side of FIG. 1; and,
FIG. 6 is a right side elevational view thereof.
Referenced Cited
Patent History
Patent number: D383989
Type: Grant
Filed: Mar 5, 1996
Date of Patent: Sep 23, 1997
Assignee: Societe Chauvin Arnoux
Inventors: Daniel Arnoux (Paris), Axel Arnoux (Paris)
Primary Examiner: Antoine Duval Davis
Attorney: John L. Welch
Application Number: 0/51,095
Type: Grant
Filed: Mar 5, 1996
Date of Patent: Sep 23, 1997
Assignee: Societe Chauvin Arnoux
Inventors: Daniel Arnoux (Paris), Axel Arnoux (Paris)
Primary Examiner: Antoine Duval Davis
Attorney: John L. Welch
Application Number: 0/51,095
Classifications