Diagnostic testing instrument

- Gen-Probe Incorporated
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Description

FIG. 1 is a top, front and left side perspective view of our new design for a diagnostic testing instrument;

FIG. 2 is a top, front and right side perspective view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a plan view thereof;

FIG. 5 is a rear elevation view thereof;

FIG. 6 is a left side elevation view thereof; and,

FIG. 7 is right side elevation view thereof.

Referenced Cited
U.S. Patent Documents
D282203 January 14, 1986 Leonard et al.
D326908 June 9, 1992 Gilbert et al.
D369564 May 7, 1996 Whitby et al.
5147610 September 15, 1992 Watanabe et al.
5270210 December 14, 1993 Weyrauch et al.
Patent History
Patent number: D410080
Type: Grant
Filed: Oct 13, 1997
Date of Patent: May 18, 1999
Assignee: Gen-Probe Incorporated (San Diego, CA)
Inventors: Brian Heidsiek (Los Angeles, CA), Larry G. Tang (Valley Village, CA), Jonathan Scheiner (Topanga, CA), Karel J. Golta (Glendale, CA)
Primary Examiner: Pamela Burgess
Attorney: Charles B. Cappellari
Application Number: 0/78,352
Classifications
Current U.S. Class: Equipment For Diagnosis, Analysis, Or Treatment (D24/107)
International Classification: 2902;