Enclosure for analytical instrumentation

- The Perkin-Elmer Corp.
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Description

FIG. 1 is an isometric view of an enclosure for analytical instrumentaton showing our new design;

FIG. 2 is a top elevational view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a rear elevational view thereof; and,

FIG. 7 is a bottom elevational view thereof.

Referenced Cited
U.S. Patent Documents
D338419 August 17, 1993 Frankel et al.
D369564 May 7, 1996 Whitby et al.
D373830 September 17, 1996 LaBarbera et al.
4783174 November 8, 1988 Gmelin et al.
5590537 January 7, 1997 Vogel
5655681 August 12, 1997 Voge et al.
5671603 September 30, 1997 McCorkle et al.
5672289 September 30, 1997 O'Neill
5813763 September 29, 1998 Plotnikov et al.
5842788 December 1, 1998 Danley
Patent History
Patent number: D412991
Type: Grant
Filed: Jan 16, 1997
Date of Patent: Aug 17, 1999
Assignee: The Perkin-Elmer Corp. (Norwalk, CT)
Inventors: Michael P DiVito (Beacon Falls, CT), Ernest M. Bevilacqua (Wilton, CT), Marcel Margulies (Scarsdale, NY), E. Joel McCorkle (Woodbury, CT), Ralph W. Keese (Trumbull, CT), Donald G. Mackay (Roxbury, CT)
Primary Examiner: Stella Reid
Attorney: David Aker
Application Number: 0/64,998
Classifications
Current U.S. Class: Laboratory Equipment Not Elsewhere Specified (D24/232)
International Classification: 2401;