Stack thickness measuring gauge

Description

FIG. 1 is a perspective view of a stack thickness measuring gauge, as seen from the front and one side, showing my new design;

FIG. 2 is an elevational view thereof, as taken from the other side, the two sides being mirror images of each other;

FIG. 3 is is a top plan view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof; and,

FIG. 6 is a bottom plan view thereof.

Being shown in an arbitrary orientation for illustrative purposes, the stack thickness measuring gauge is useful also in different orientations. In FIG. 1, broken-line showings of a user's hand and of a stack of sheets are for illustrative purposes only and form no part of the claimed design.

Referenced Cited
U.S. Patent Documents
205225 June 1878 Wight
477183 June 1892 McLane
1196188 August 1916 Wahlberg
1299256 April 1919 Stenger
2794257 June 1957 Blake, Jr.
2799939 July 1957 Bivans
3751814 August 1973 Crawford
3999667 December 28, 1976 Barnard
4455753 June 26, 1984 Keyes
4519142 May 28, 1985 Parker
5235756 August 17, 1993 Wickenhaver
5249366 October 5, 1993 Takahashi et al.
5390427 February 21, 1995 Heller et al.
Patent History
Patent number: D415700
Type: Grant
Filed: Nov 23, 1998
Date of Patent: Oct 26, 1999
Assignee: Charles W. Goff
Inventor: Joel B. Bagnal (Ponte Vedra Beach, FL)
Primary Examiner: Antoine Duval Davis
Application Number: 0/96,899
Classifications
Current U.S. Class: Template Or Comparator Gauge (6) (D10/64)
International Classification: 1004;