Stack thickness measuring gauge
Description
FIG. 1 is a perspective view of a stack thickness measuring gauge, as seen from the front and one side, showing my new design;
FIG. 2 is an elevational view thereof, as taken from the other side, the two sides being mirror images of each other;
FIG. 3 is is a top plan view thereof;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof; and,
FIG. 6 is a bottom plan view thereof.
Being shown in an arbitrary orientation for illustrative purposes, the stack thickness measuring gauge is useful also in different orientations. In FIG. 1, broken-line showings of a user's hand and of a stack of sheets are for illustrative purposes only and form no part of the claimed design.
Referenced Cited
U.S. Patent Documents
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477183 | June 1892 | McLane |
1196188 | August 1916 | Wahlberg |
1299256 | April 1919 | Stenger |
2794257 | June 1957 | Blake, Jr. |
2799939 | July 1957 | Bivans |
3751814 | August 1973 | Crawford |
3999667 | December 28, 1976 | Barnard |
4455753 | June 26, 1984 | Keyes |
4519142 | May 28, 1985 | Parker |
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5249366 | October 5, 1993 | Takahashi et al. |
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Patent History
Patent number: D415700
Type: Grant
Filed: Nov 23, 1998
Date of Patent: Oct 26, 1999
Assignee: Charles W. Goff
Inventor: Joel B. Bagnal (Ponte Vedra Beach, FL)
Primary Examiner: Antoine Duval Davis
Application Number: 0/96,899
Type: Grant
Filed: Nov 23, 1998
Date of Patent: Oct 26, 1999
Assignee: Charles W. Goff
Inventor: Joel B. Bagnal (Ponte Vedra Beach, FL)
Primary Examiner: Antoine Duval Davis
Application Number: 0/96,899
Classifications