Current probe
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Description
FIG. 1 is a perspective view of a current probe showing the first embodiment of my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top elevational view thereof;
FIG. 5 is a bottom elevational view thereof;
FIG. 6 is a left elevational view thereof;
FIG. 7 is a right elevational view thereof;
FIG. 8 is a perspective view of a current probe showing the second embodiment of my new design;
FIG. 9 is a front elevational view thereof;
FIG. 10 is a rear elevational view thereof;
FIG. 11 is a top elevational view thereof;
FIG. 12 is a bottom elevational view thereof;
FIG. 13 is a left elevational view thereof; and,
FIG. 14 is a right elevational view thereof.
Referenced Cited
Patent History
Patent number: D419083
Type: Grant
Filed: Dec 9, 1998
Date of Patent: Jan 18, 2000
Assignee: Bell Technologies Inc. (Orlando, FL)
Inventor: Matt H. Shafie (Casselberry, FL)
Primary Examiner: Antoine Duval Davis
Law Firm: Stein, Schifino & Van Der Wall
Application Number: 0/97,561
Type: Grant
Filed: Dec 9, 1998
Date of Patent: Jan 18, 2000
Assignee: Bell Technologies Inc. (Orlando, FL)
Inventor: Matt H. Shafie (Casselberry, FL)
Primary Examiner: Antoine Duval Davis
Law Firm: Stein, Schifino & Van Der Wall
Application Number: 0/97,561
Classifications