Current probe

- Bell Technologies Inc.
Description

FIG. 1 is a perspective view of a current probe showing the first embodiment of my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top elevational view thereof;

FIG. 5 is a bottom elevational view thereof;

FIG. 6 is a left elevational view thereof;

FIG. 7 is a right elevational view thereof;

FIG. 8 is a perspective view of a current probe showing the second embodiment of my new design;

FIG. 9 is a front elevational view thereof;

FIG. 10 is a rear elevational view thereof;

FIG. 11 is a top elevational view thereof;

FIG. 12 is a bottom elevational view thereof;

FIG. 13 is a left elevational view thereof; and,

FIG. 14 is a right elevational view thereof.

Referenced Cited
U.S. Patent Documents
D254536 March 25, 1980 Davis et al.
D358349 May 16, 1995 Kuramoto
D401172 November 17, 1998 Kuramoto
Patent History
Patent number: D419083
Type: Grant
Filed: Dec 9, 1998
Date of Patent: Jan 18, 2000
Assignee: Bell Technologies Inc. (Orlando, FL)
Inventor: Matt H. Shafie (Casselberry, FL)
Primary Examiner: Antoine Duval Davis
Law Firm: Stein, Schifino & Van Der Wall
Application Number: 0/97,561
Classifications
Current U.S. Class: Clamp-around Type (D10/79)
International Classification: 1004;