IC test-head stand
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FIG. 1 is a perspective view of an IC test-head stand according to a first embodiment of the present design.
FIG. 2 is a front view of the IC test-head stand shown in FIG. 1. A rear view of the IC test-head stand is omitted from the drawing since the rear view is symmetrical with the front view.
FIG. 3 is a left side view of the IC test-head stand shown in FIG. 1.
FIG. 4 is a right side view of the IC test-head stand shown in FIG. 1.
FIG. 5 is a top plan view of the IC test-head stand shown in FIG. 1.
FIG. 6 is a bottom plan view of the IC test-head stand shown in FIG. 1.
FIG. 7 is a perspective view of an IC test-head stand according to a second embodiment of the present design.
FIG. 8 is a front view of the IC test-head stand shown in FIG. 7. A rear view of the IC test-head stand is omitted from the drawing since the rear view is symmetrical with the front view.
FIG. 9 is a left side view of the IC test-head stand shown in FIG. 7.
FIG. 10 is a right side view of the IC test-head stand shown in FIG. 7.
FIG. 11 is a top plan view of the IC test-head stand shown in FIG. 7.
FIG. 12 is a bottom plan view of the IC test-head stand shown in FIG. 7.
FIG. 13 is a perspective view of an IC test-head stand according to a third embodiment of the present design.
FIG. 14 is a front view of the IC test-head stand shown in FIG. 13. A rear view of the IC test-head stand is omitted from the drawing since the rear view is symmetrical with the front view.
FIG. 15 is a left side view of the IC test-head stand shown in FIG. 13.
FIG. 16 is a right side view of the IC test-head stand shown in FIG. 13.
FIG. 17 is a top plan view of the IC test-head stand shown in FIG. 13.
FIG. 18 is a bottom plan view of the IC test-head stand shown in FIG. 13; and,
FIG. 19 is a front view of the IC test-head stand shown in FIG. 1, for illustrating the use of the IC test-head stand.
The broken line showing is for illustrative purposes only and forms no part of the claimed design.
Type: Grant
Filed: Dec 30, 1998
Date of Patent: Feb 22, 2000
Assignee: Advantest Corporation (Tokyo)
Inventor: Takayuki Yano (Tokyo)
Primary Examiner: Antoine Duval Davis
Law Firm: Birch, Stewart, Kolasch & Birch, LLP
Application Number: 0/98,530
International Classification: 1004;
