Coaxial test probe

Skip to: Description  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of the coaxial test probe showing the new design;

FIG. 2 is a top elevational view of the embodiment of FIG. 1;

FIG. 3 is a left side elevational view of the embodiment of FIG. 1, the right side being a mirror image thereof;

FIG. 4 is a bottom elevational view of the embodiment of FIG. 1;

FIG. 5 is a front elevational view of the embodiment of FIG. 1; and,

FIG. 6 is a rear elevational view of the embodiment of FIG. 1 .

Referenced Cited
U.S. Patent Documents
D343802 February 1, 1994 Kornowski et al.
D395016 June 9, 1998 Kornwoski et al.
4764722 August 16, 1988 Coughlin et al.
Patent History
Patent number: D422230
Type: Grant
Filed: Sep 22, 1998
Date of Patent: Apr 4, 2000
Assignee: Delaware Capital Formation, Inc. (Wilmington, DE)
Inventor: Charles J. Johnston (Walnut, CA)
Primary Examiner: Antoine Duval Davis
Law Firm: Christie, Parker & Hale, LLP
Application Number: 0/93,915
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80); Threaded Engagement (D13/151)
International Classification: 1004;