Abstract: A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.

Abstract: A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.

Abstract: A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.

Abstract: A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.

Abstract: A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.

Abstract: A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.

Abstract: A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.

Abstract: A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.

Abstract: An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact component is in contact with the first contact component. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.

Abstract: A translator fixture for use in testing high frequency or high speed digital circuit boards. The fixture has a pin supporting top plate and base plate and coaxial constant impedance test pins incorporated into the fixture to provide a signal path from a test analyzer to the circuit board under test. The board under test is coupled to an upper surface of the top plate. The impedance of the coaxial pins is matched to the impedance of the board under test as well as the impedance of the test analyzer. Force exerted on the coaxial pins ensures contact of the pins with test points on the circuit board under test. The force may be exerted by spring loaded probes mounted on a compliant test interface below the base plate. The force may also be exerted by Euler buckling the pins by relative movement between the circuit board under test and a second circuit board coupled to the base plate or to the test analyzer.

Abstract: An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact tip is in contact with the first contact tip. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.

Abstract: A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.

Abstract: A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals.

Abstract: A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals.

Abstract: A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A ball is positioned between the spring and a beveled edge of the plunger to aid in biasing the plunger.

Abstract: A solid spring electrical connector includes an elongated metal bar of sufficient cross sectional area to carry high electrical current loads. The bar is contained in a barrel with terminals of the bar projecting from opposite ends of the barrel. The bar is an integral piece which includes a spring section extending most of the length of the bar. The spring section is formed by axially spaced-apart, parallel, linear, narrow-profile notches of generally uniform width having alternating open ends facing toward opposite sides of the bar progressively along its length. Each notch extends across a major portion of the diameter of the bar thereby forming a resilient spring section in which the metal between adjacent notches forms the equivalent of long narrow flexible beams with alternating pivot points. In an alternate embodiment, electrical connectors adapted for mounting to printed circuit boards include a plurality of spring contacts in a row along the length of the connector.

Abstract: A hollow plunger spring probe assembly for performing tests on an electrical device including a probe receptacle for receipt of the hollow plunger. The plunger includes a tip at one end of the plunger for contacting the electrical device and a spring positioned within the opening in the plunger between the tip and a receptacle post having a head portion extending into the plunger through a second end. The post is rigidly attached to the receptacle. The plunger includes an attachment mechanism for releasably attaching the plunger to the head portion of the post.