Electrical instrument probe tip

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Description

FIG. 1 is a perspective view of an electrical instrument probe tip showing my new design;

FIG. 2 is a right side elevational view thereof, the left side elevational view being a mirror image of FIG. 2;

FIG. 3 is a top elevational view thereof;

FIG. 4 is a bottom elevational view thereof; and,

FIG. 5 is a front elevational view thereof.

The broken line representations of an electrical instrument in FIGS. 1-5 are exemplary and form no part of the claimed design.

Referenced Cited
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Patent History
Patent number: D422518
Type: Grant
Filed: Apr 15, 1999
Date of Patent: Apr 11, 2000
Assignee: Applied Power Inc. (Butler, WI)
Inventor: Thomas M. Luebke (Menomonee Falls, WI)
Primary Examiner: Antoine Duval Davis
Law Firm: Quarles & Brady LLP
Application Number: 0/103,523
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80)
International Classification: 1004;