Test probe plunger tip

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Description

FIG. 1 is a perspective view of the test probe plunger tip showing the new design;

FIG. 2 is a left side elevational view of the embodiment of FIG. 1;

FIG. 3 is a front elevational view of the embodiment of FIG. 1;

FIG. 4 is a right side elevational view of the embodiment of FIG. 1;

FIG. 5 is a back elevational view of the embodiment of FIG. 1;

FIG. 6 is a bottom elevational view of the embodiment of FIG. 1; and,

FIG. 7 is a top elevational view of the embodiment of FIG. 1.

Referenced Cited
U.S. Patent Documents
4560926 December 24, 1985 Cornu et al.
5227718 July 13, 1993 Stowers et al.
Patent History
Patent number: D400811
Type: Grant
Filed: Nov 21, 1997
Date of Patent: Nov 10, 1998
Assignee: Delaware Capital Formation, Inc. (Wilmington, DE)
Inventors: Mark A. Swart (Anaheim Hills, CA), Charles J. Johnston (Walnut, CA), Gordon A. Vinther (Ontario, CA)
Primary Examiner: Antoine Duval Davis
Law Firm: Christie, Parker & Hale, LLP
Application Number: 0/79,957
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80)
International Classification: 1004;