Measuring instrument
Latest Ch. Beha GmbH Technische Neuentwicklungen Patents:
Description
FIG. 1 is an oblique perspective view of the top, left and rear of the measuring instrument;
FIG. 2 is a top plan view of the measuring instrument;
FIG. 3 is a bottom plan view of the measuring instrument;
FIG. 4 is a left side elevational view of the measuring instrument;
FIG. 5 is a right side elevational view of the measuring instrument;
FIG. 6 is a rear elevational view of the measuring instrument; and,
FIG. 7 is a front elevational view of the measuring instrument.
Referenced Cited
Patent History
Patent number: D423384
Type: Grant
Filed: Jun 4, 1999
Date of Patent: Apr 25, 2000
Assignee: Ch. Beha GmbH Technische Neuentwicklungen (Glottertal)
Inventor: Christian Beha (Glottertal)
Primary Examiner: Antoine Duval Davis
Attorneys: Nath & Associates, Nath & Associates
Application Number: 0/105,873
Type: Grant
Filed: Jun 4, 1999
Date of Patent: Apr 25, 2000
Assignee: Ch. Beha GmbH Technische Neuentwicklungen (Glottertal)
Inventor: Christian Beha (Glottertal)
Primary Examiner: Antoine Duval Davis
Attorneys: Nath & Associates, Nath & Associates
Application Number: 0/105,873
Classifications