Measuring instrument

Description

FIG. 1 is an oblique perspective view of the top, left and rear of the measuring instrument;

FIG. 2 is a top plan view of the measuring instrument;

FIG. 3 is a bottom plan view of the measuring instrument;

FIG. 4 is a left side elevational view of the measuring instrument;

FIG. 5 is a right side elevational view of the measuring instrument;

FIG. 6 is a rear elevational view of the measuring instrument; and,

FIG. 7 is a front elevational view of the measuring instrument.

Referenced Cited
U.S. Patent Documents
D369306 April 30, 1996 Fisher
D414125 September 21, 1999 Chen
Patent History
Patent number: D423384
Type: Grant
Filed: Jun 4, 1999
Date of Patent: Apr 25, 2000
Assignee: Ch. Beha GmbH Technische Neuentwicklungen (Glottertal)
Inventor: Christian Beha (Glottertal)
Primary Examiner: Antoine Duval Davis
Attorneys: Nath & Associates, Nath & Associates
Application Number: 0/105,873
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)
International Classification: 1004;