Clamp ohmmeter
Description
FIG. 1 is a front-right-top perspective view of a clamp ohmmeter, showing my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left elevational view thereof;
FIG. 5 is a right elevational view thereof;
FIG. 6 is top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
Referenced Cited
Patent History
Patent number: D425438
Type: Grant
Filed: Jun 25, 1999
Date of Patent: May 23, 2000
Inventor: Lee-Fei Chen (Taipei)
Primary Examiner: Antoine Duval Davis
Application Number: 0/107,117
Type: Grant
Filed: Jun 25, 1999
Date of Patent: May 23, 2000
Inventor: Lee-Fei Chen (Taipei)
Primary Examiner: Antoine Duval Davis
Application Number: 0/107,117
Classifications