Measurement surveying device

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Description

FIG. 1 is a perspective view of the mesurement surveying device;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D367233 February 20, 1996 Hoshina
D375464 November 12, 1996 Hoshino
D389418 January 20, 1998 Takayama et al.
D409507 May 11, 1999 Ishii
5907907 June 1, 1999 Ohtomo et al.
Other references
  • 943897 Jan. 1996 Japan. 943897-similar 2, Jun. 1997 Japan. 943897-similar 3, Jul. 1998 Japan. 943897-similar 4, Jul. 1998 Japan. 943897-similar 5, Jun. 1998 Japan. 943897-similar 6, Apr. 1999 Japan. 943897-similar 7, Apr. 1999 Japan. 943897-similar 8, Apr. 1999 Japan.
Patent History
Patent number: D427087
Type: Grant
Filed: Jun 21, 1999
Date of Patent: Jun 27, 2000
Assignee: Asahi Seimitsu Kabushiki Kaisha (Tokyo)
Inventors: Kenji Kaneko (Tokyo), Masayuki Ueno (Tokyo), Akira Wakabayashi (Tokyo)
Primary Examiner: Antoine Duval Davis
Law Firm: Sughrue, Mion, Zinn, Macpeak & Seas, PLLC
Application Number: 0/106,606
Classifications
Current U.S. Class: Transit Or Theodolite (D10/66)
International Classification: 1004;