Electrical test probe wedge tip
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FIG. 1 is a general perspective view of an electrical test probe wedge tip showing the new design, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 2 is a front view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 3 is a right side view of the electrical test probe wedge tip, the left side view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 4 is a back view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 5 is a top view of the electrical test probe wedge tip; and,
FIG. 6 is a bottom view of the electrical test probe wedge tip.
Claims
The ornamental design for an electrical test probe wedge tip, as shown and described.
Type: Grant
Filed: Jul 31, 2000
Date of Patent: Jul 3, 2001
Assignee: LeCroy Corporation (Beaverton, OR)
Inventor: Julie A. Campbell (Beaverton, OR)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Miller Nash LLP
Application Number: 29/127,136
