Abstract: A compensating resistance adapter spans the distance from a mechanical point of contact of an electrical test probe and at least one signal testing point. The compensating resistance adapter has at least one transmission path extending longitudinally therewith. At least one compensating network is configured with the transmission path and positioned substantially near the probing end thereof. For preferred compensating resistance adapters, the at least one compensating network compensates for inductance caused by the conductive connector adapter. For preferred compensating resistance adapters, the at least one compensating network when used in combination with the electrical test probe is optimized to the signal testing point. Exemplary preferred compensating resistance adapters include a probing blade adapter, a twisted pair adapter, a Y-lead adapter, and a swivel pogo tip pair adapter.

Abstract: A method is provided which measures PCB trace characteristics from measurements of a PCB trace structure.

Abstract: A complex acquisition system and method for synchronizing components thereof. The complex acquisition system further including a master acquisition module. The master acquisition module further including an analog to digital acquisition signal generator for generating an analog to digital acquisition signal, a memory acquisition signal generator for generating a memory acquisition signal, a delay calibration signal for generating a delay calibration signal, a step source signal generator for generating a step source signal, and a synchronization module. The complex acquisition system further includes a plurality of slave acquisition modules, each also including a synchronization module. The complex acquisition system additionally includes a distribution system for distributing each of the analog to digital acquisition signal, memory acquisition signal, delay calibration signal and step source signal to each of the synchronization modules in the master and plurality of slave acquisition modules.

Abstract: A method is provided for de-embedding fixtures and/or probes from measurements of devices where probes and fixtures are connected between the ports of a network analysis instrument and a device-under-test.

Abstract: A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously, It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations.

Abstract: A time domain measurement method and apparatus are provided. The method comprises the steps of acquiring a burst signal and determining a plurality of min/max values of the burst signal. The determined min values are connected to generate a lower floor outline. The determined max values are connected to generate an upper roof outline. The burst signal is displayed along with the lower and upper outlines.

Abstract: A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously. It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations.

Abstract: A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.

Abstract: A locater tool for positioning a support device for supporting a test probe head or a test probe tip, the locater tool including a template, means for indicating a support device position associated with the template, and means for indicating an achievable probing zone on a surface having connection points when the support device is in the support device position. The locater tool may be a device-attachable locater tool or a pre-positioning locater tool.

Abstract: A method for improving bandwidth of an oscilloscope involves, in preferred embodiments, the use of frequency up-conversion and down-conversion techniques. In an illustrative embodiment the technique involves separating an input signal into a high frequency content and a low frequency content, down-converting the high frequency content in the analog domain so that it may be processed by the oscilloscope's analog front end, digitizing the low frequency content and the down-converted high frequency content, and forming a digital representation of the received analog signal from the digitized low frequency content and high frequency content.

Abstract: A conductive connector includes a flexible-deflectable extension having a probing end and a head connection end. A conductive transmission path extends between the probing end and the head connection end. A pogo-rotational-action pin is electrically connected to the transmission path at the head connection end of the flexible-deflectable extension.

Abstract: A method for improving bandwidth of an oscilloscope involves, in preferred embodiments, the use of frequency up-conversion and down-conversion techniques. In an illustrative embodiment the technique involves separating an input signal into a high frequency content and a low frequency content, down-converting the high frequency content in the analog domain so that it may be processed by the oscilloscope's analog front end, digitizing the low frequency content and the down-converted high frequency content, and forming a digital representation of the received analog signal from the digitized low frequency content and high frequency content.

Abstract: A signal integrity network analyzer is provided. The analyzer preferably includes a characterization module for characterizing a device under test, an acquisition module for acquiring a waveform, a de-embedding module for selectively embedding and de-embedding on or more system fixtures, and an analysis module for performing analysis on the acquired waveform, with one or more system features selectively embedded or de-embedded. A single user interface is provided and is adapted to control the characterization module, the acquisition module, the de-embedding module and the analysis module.

Abstract: A system and method for performing a time domain reflectometry measurement. The system includes a coherent interleaved sampling timebase, a sampling strobe generator for generating one or more sampling strobes in accordance with the coherent interleaved sampling timebase, a time domain reflectometry sampling strobe generator for generating one or more time domain reflectometry strobes in accordance with one or more of the generated sampling strobes; and a sampling module for sampling a time domain reflectometry signal in accordance with one or more of the one or more generated sampling strobes and one or more of the one or more generated time domain reflectometry strobes. The system further includes an analog to digital converter for analog to digital converting the samples of the time domain reflectometry signal and a memory for storing the converted samples of the time domain reflectometry signal.

Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.

Abstract: A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.

Abstract: A synchronization apparatus and method for synchronizing a plurality of test and measurement apparatuses or signal generators are provided. A trigger selector is provided or for selecting from a plurality of triggers to be provided to the plurality of test and measurement apparatuses. A trigger enabled input is also provided for receiving a trigger enabled signal from each of the plurality of test and measurement apparatuses and a synchronizing block is provided for generating a single synchronized time stamp signal with the selected trigger and the trigger enabled inputs. A plurality of trigger outputs are also provided for providing the time stamp signal to a trigger input of each of the plurality of test and measurement apparatuses.

Abstract: A method and apparatus are provided for the removal of significant broadband noise from waveforms acquired for time domain network analysis.

Abstract: A method and apparatus for capturing an analog waveform on a serial bus. The method comprises the steps of designating a predetermined digital data sequence, decoding a serial data signal carried on a serial data bus, and comparing the decoded serial data signal to the predetermined digital data sequence. When it is determined that a portion of the decoded serial data matches the predetermined digital data sequence, the portion of the serial data signal corresponding to the matching portion of the decoded serial data signal is marked.

Abstract: Systems that sample a continuous analog time-domain signal.The invention is particularly applicable to systems that sample a continuous analog time-domain signal and whose analog components have a bandwidth limit below that desired or specified. The invention has been created to address particular problems in the design of digital sampling oscilloscopes (DSOs) that require more bandwidth than that which is easily achievable through traditionally analog techniques. A method and apparatus are provided in the form of a digital filter that is capable of surgically increasing the bandwidth of the system beyond the bandwidth achievable in an analog system. Furthermore, it is demonstrated that this system can perform this bandwidth increase without degradation in the time-domain performance of the system such as pulse or step response. In some cases, the time-domain performance is improved by flattening of the frequency response.