Measuring apparatus for measuring a particle size distribution

- Sysmex Corporation
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front view of a measuring apparatus for measuring a particle size distribution showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.

Claims

The ornamental design for a measuring apparatus for measuring a particle size distribution, as shown and described.

Referenced Cited
U.S. Patent Documents
6191853 February 20, 2001 Yamaguchi et al.
Patent History
Patent number: D447967
Type: Grant
Filed: Nov 8, 2000
Date of Patent: Sep 18, 2001
Assignee: Sysmex Corporation (Kobe)
Inventors: Koji Terada (Yokohama), Kaoru Takarada (Miki), Kenichi Inami (Kobe)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Cohen, Pontani, Lieberman & Pavane
Application Number: 29/132,403
Classifications
Current U.S. Class: Electrical Property (D10/75); Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46)
International Classification: 1004;