Digital electronic test instrument
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Description
FIG. 1 is a perspective view of a digital electronic test instrument embodying my new design;
FIG. 2 is a front plan view thereof;
FIG. 3 is a top elevation view thereof;
FIG. 4 is a bottom elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a right side elevation view thereof; and,
FIG. 7 is a back plan view thereof.
The broken lines shown in FIG. 1 are for illustrative purposes only and form no part of the claimed design.
Claims
The ornamental design for a digital electronic test instrument, as shown and described.
Referenced Cited
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Patent History
Patent number: D474414
Type: Grant
Filed: Jul 19, 2002
Date of Patent: May 13, 2003
Assignee: Fluke Corporation (Everett, WA)
Inventors: John K. Ikeda (Seattle, WA), Christopher W. Lagerberg (Seattle, WA)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Richard A. Koske
Application Number: 29/164,292
Type: Grant
Filed: Jul 19, 2002
Date of Patent: May 13, 2003
Assignee: Fluke Corporation (Everett, WA)
Inventors: John K. Ikeda (Seattle, WA), Christopher W. Lagerberg (Seattle, WA)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Richard A. Koske
Application Number: 29/164,292
Classifications