Innovative micrometric measuring instrument
Latest Hung Fu Group of Companies Patents:
Description
FIG. 1 is a front elevational view of an innovative micrometric measuring instrument showing my new design;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a left side elevational view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a top plan elevational view thereof;
FIG. 6 is a bottom plan elevational view thereof; and,
FIG. 7 is a top, front and right perspective elevational view thereof.
Claims
The ornamental design for an innovative micrometric measuring instrument, as shown and described.
Patent History
Patent number: D476020
Type: Grant
Filed: Jul 15, 2002
Date of Patent: Jun 17, 2003
Assignee: Hung Fu Group of Companies (Taipei)
Inventor: Chiang Chin Chih (Taipei)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Dennison, Schultz & Dougherty
Application Number: 29/163,809
Type: Grant
Filed: Jul 15, 2002
Date of Patent: Jun 17, 2003
Assignee: Hung Fu Group of Companies (Taipei)
Inventor: Chiang Chin Chih (Taipei)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Dennison, Schultz & Dougherty
Application Number: 29/163,809
Classifications
Current U.S. Class:
Microscope (D16/131);
Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46)
International Classification: 1606;
International Classification: 1606;