Innovative micrometric measuring instrument

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Description

FIG. 1 is a front elevational view of an innovative micrometric measuring instrument showing my new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan elevational view thereof;

FIG. 6 is a bottom plan elevational view thereof; and,

FIG. 7 is a top, front and right perspective elevational view thereof.

Claims

The ornamental design for an innovative micrometric measuring instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D359059 June 6, 1995 Omi
5694242 December 2, 1997 Omi
Patent History
Patent number: D476020
Type: Grant
Filed: Jul 15, 2002
Date of Patent: Jun 17, 2003
Assignee: Hung Fu Group of Companies (Taipei)
Inventor: Chiang Chin Chih (Taipei)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Dennison, Schultz & Dougherty
Application Number: 29/163,809
Classifications
Current U.S. Class: Microscope (D16/131); Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46)
International Classification: 1606;