EMF tester

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Description

FIG. 1 is a perspective view of an EMF tester, showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left elevational view thereof;

FIG. 5 is a right elevational view thereof;

FIG. 6 is top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for a EMF tester, as shown.

Referenced Cited
U.S. Patent Documents
5435168 July 25, 1995 Granere
6186959 February 13, 2001 Canfield et al.
6259257 July 10, 2001 Hawkins, Sr.
6492957 December 10, 2002 Carillo, Jr. et al.
Patent History
Patent number: D478016
Type: Grant
Filed: Sep 24, 2002
Date of Patent: Aug 5, 2003
Inventor: Li-Chuan Chen (Taipei)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Rosenberg, Klein & Lee
Application Number: 29/167,884
Classifications
Current U.S. Class: Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46); Provided With Handle, Or Hand-held (D10/78)
International Classification: 1004;