Thermometry probe

- Welch Allyn, Inc.
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Description

FIG. 1 is a rear perspective view of the thermometry probe of the invention (with a connection cable used therewith shown in phantom);

FIG. 2 is a side elevation view of the thermometry probe thereof;

FIG. 3 is a top view of the thermometry probe thereof;

FIG. 4 is a bottom view of the thermometry probe thereof;

FIG. 5 is a rear-end view of the thermometry probe; and,

FIG. 6 is a front-end view of the thermometry probe thereof.

Claims

The ornamental design for a thermometry probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D250753 January 9, 1979 Turner et al.
6461037 October 8, 2002 O'Leary
6495806 December 17, 2002 Siefert
Patent History
Patent number: D480977
Type: Grant
Filed: Oct 3, 2002
Date of Patent: Oct 21, 2003
Assignee: Welch Allyn, Inc. (Skaneateles Falls, NY)
Inventors: Thaddeus J. Wawro (Auburn, NY), Alan S. Knieriem (Baldwinsville, NY), Robert S. Englert (Syracuse, NY), Chad P. Paris (Camillus, NY), Scott W. Osiecki (Skaneateles, NY)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Wall Marjama & Bilinski LLP
Application Number: 29/168,487
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/60)
International Classification: 1004;