Testing machine
Latest Hon Hai Precision Ind. Co., Ltd. Patents:
Description
FIG. 1 is a perspective view of a testing machine of our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
Claims
The ornamental design for a testing machine, as shown.
Referenced Cited
Patent History
Patent number: D481962
Type: Grant
Filed: Sep 11, 2002
Date of Patent: Nov 11, 2003
Assignee: Hon Hai Precision Ind. Co., Ltd. (Taipei Hsien)
Inventors: Chun Nan Ou (Shenzhen), GaLei Hu (Shenzhen), Lin Yan (Santa Clara, CA), TaiPing Zhou (Santa Clara), Yue Qing Zhao (Shenzhen)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Wei Te Chung
Application Number: 29/167,341
Type: Grant
Filed: Sep 11, 2002
Date of Patent: Nov 11, 2003
Assignee: Hon Hai Precision Ind. Co., Ltd. (Taipei Hsien)
Inventors: Chun Nan Ou (Shenzhen), GaLei Hu (Shenzhen), Lin Yan (Santa Clara, CA), TaiPing Zhou (Santa Clara), Yue Qing Zhao (Shenzhen)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Wei Te Chung
Application Number: 29/167,341
Classifications