Sample analyzer
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FIG. 1 is a front view of a sample analyzer showing our new design;
FIG. 2 is a rear view of the sample analyzer of FIG. 1;
FIG. 3 is a right side view of the sample analyzer of FIG. 1;
FIG. 4 is a left side view of the sample analyzer of FIG. 1;
FIG. 5 is a top plan view of the sample analyzer of FIG. 1;
FIG. 6 is a bottom plan view of the sample analyzer of FIG. 1;
FIG. 7 is a cross-sectional view of the sample analyzer taken along the lines 7—7 in FIG. 1;
FIG. 8 is a cross-sectional view of the sample analyzer taken along the lines 8—8 in FIG. 1; and,
FIG. 9 is a perspective view of the sample analyzer of FIG. 1 in which a vessel accommodation rack is attached to the sample analyzer and the opening/closing port is open.
The broken lines in FIG. 9 are for illustrative purposes only and form no part of the claimed design.
Claims
The ornamental design for a sample analyzer, as shown and described.
Type: Grant
Filed: Mar 4, 2002
Date of Patent: Nov 25, 2003
Assignee: Sysmex Corporation (Hyogo)
Inventors: Yasuhiro Oyama (Kobe), Kazuyuki Sakurai (Akashi), Yoichi Nakamura (Kobe), Noriyoshi Yoshida (Kobe), Kazutoshi Tokunaga (Kakogawa), Masami Ishizaki (Fujimi)
Primary Examiner: Ian Simmons
Attorney, Agent or Law Firm: Cohen, Pontani, Lieberman & Pavane
Application Number: 29/156,653
International Classification: 2401;
