Sample analyzer

- Sysmex Corporation
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Description

FIG. 1 is a front view of a sample analyzer showing our new design;

FIG. 2 is a rear view of the sample analyzer of FIG. 1;

FIG. 3 is a right side view of the sample analyzer of FIG. 1;

FIG. 4 is a left side view of the sample analyzer of FIG. 1;

FIG. 5 is a top plan view of the sample analyzer of FIG. 1;

FIG. 6 is a bottom plan view of the sample analyzer of FIG. 1;

FIG. 7 is a cross-sectional view of the sample analyzer taken along the lines 7—7 in FIG. 1;

FIG. 8 is a cross-sectional view of the sample analyzer taken along the lines 8—8 in FIG. 1; and,

FIG. 9 is a perspective view of the sample analyzer of FIG. 1 in which a vessel accommodation rack is attached to the sample analyzer and the opening/closing port is open.

The broken lines in FIG. 9 are for illustrative purposes only and form no part of the claimed design.

Claims

The ornamental design for a sample analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
D381749 July 29, 1997 Lawrence et al.
D381756 July 29, 1997 Ohnuma et al.
D424956 May 16, 2000 von Buelow et al.
D467349 December 17, 2002 Niedbala et al.
Patent History
Patent number: D482796
Type: Grant
Filed: Mar 4, 2002
Date of Patent: Nov 25, 2003
Assignee: Sysmex Corporation (Hyogo)
Inventors: Yasuhiro Oyama (Kobe), Kazuyuki Sakurai (Akashi), Yoichi Nakamura (Kobe), Noriyoshi Yoshida (Kobe), Kazutoshi Tokunaga (Kakogawa), Masami Ishizaki (Fujimi)
Primary Examiner: Ian Simmons
Attorney, Agent or Law Firm: Cohen, Pontani, Lieberman & Pavane
Application Number: 29/156,653
Classifications
Current U.S. Class: Laboratory Equipment Not Elsewhere Specified (D24/232)
International Classification: 2401;