Specimen testing device

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Description

FIG. 1 is top plan view of a specimen testing device showing my new design;

FIG. 2 is a bottom plan view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a right side elevational view thereof, the left side elevational view being identical thereto; and,

FIG. 6 is a top perspective view thereof.

Claims

The ornamental design for a specimen testing device, as shown and described.

Referenced Cited
U.S. Patent Documents
D288744 March 17, 1987 Taylor
D299859 February 14, 1989 Fan et al.
D299860 February 14, 1989 Fan et al.
D309012 July 3, 1990 Vcelka
D319103 August 13, 1991 Chiu
Patent History
Patent number: D498850
Type: Grant
Filed: Dec 2, 2002
Date of Patent: Nov 23, 2004
Assignee: Daiichi Pure Chemicals Co., Ltd. (Tokyo)
Inventor: Naomi Ukon (Tokyo)
Primary Examiner: Ian Simmons
Attorney, Agent or Law Firm: Hollander Law Firm, P.L.C.
Application Number: 29/171,847