Housing for test and measurement instruments

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Description

The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like.

FIG. 1 is a perspective view of a housing for test and measurement instruments;

FIG. 2 is a front elevation view of the housing for test and measurement instruments;

FIG. 3 is a left side elevation view of the housing for test and measurement instruments;

FIG. 4 is a right side elevation view of the housing for test and measurement instruments;

FIG. 5 is a top plan view of the housing for test and measurement instruments;

FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,

FIG. 7 is a rear elevation view of the housing for test and measurement instruments.

Claims

The ornamental design of a housing for test and measurement instruments, as shown and described.

Referenced Cited
U.S. Patent Documents
D413823 September 14, 1999 Dobyns et al.
D420607 February 15, 2000 Wrisley et al.
D460371 July 16, 2002 Wrisley et al.
D460703 July 23, 2002 Wrisley et al.
6437552 August 20, 2002 Sekel et al.
D472171 March 25, 2003 Wrisley et al.
Patent History
Patent number: D500957
Type: Grant
Filed: Apr 30, 2004
Date of Patent: Jan 18, 2005
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventor: Jerry L. Wrisley (Beaverton, OR)
Primary Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 29/204,634
Classifications
Current U.S. Class: Oscilloscope Or Oscillograph (D10/76)