Housing for test and measurement instruments
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Description
FIG. 1 is a perspective view of a housing for test and measurement instruments;
FIG. 2 is a front elevation view of the housing for test and measurement instruments;
FIG. 3 is a left side elevation view of the housing for test and measurement instruments;
FIG. 4 is a right side elevation view of the housing for test and measurement instruments;
FIG. 5 is a top plan view of the housing for test and measurement instruments;
FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,
FIG. 7 is a rear elevation view of the housing for test and measurement instruments.
Claims
The ornamental design of a housing for test and measurement instruments, as shown and described.
Referenced Cited
Patent History
Patent number: D508426
Type: Grant
Filed: Apr 30, 2004
Date of Patent: Aug 16, 2005
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventor: Jerry L. Wrisley (Beaverton, OR)
Primary Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 29/204,637
Type: Grant
Filed: Apr 30, 2004
Date of Patent: Aug 16, 2005
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventor: Jerry L. Wrisley (Beaverton, OR)
Primary Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 29/204,637
Classifications
Current U.S. Class:
Oscilloscope Or Oscillograph (D10/76)