Semiconductor integrated circuit test head

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Description

FIG. 1 is a perspective view of a semiconductor integrated circuit test head showing my new design,

FIG. 2 is an end elevation thereof, the opposite end elevation being of corresponding appearance,

FIG. 3 is a side elevation thereof; and,

FIG. 4 is a top plan view thereof.

Claims

The ornamental design for a semiconductor integrated circuit test head, as shown and described.

Referenced Cited
U.S. Patent Documents
D345705 April 5, 1994 Nesbitt et al.
D369983 May 21, 1996 Fisher et al.
6642729 November 4, 2003 Kang et al.
Patent History
Patent number: D511981
Type: Grant
Filed: Mar 23, 2004
Date of Patent: Nov 29, 2005
Assignee: Credence Systems Corporation (Milpitas, CA)
Inventors: Wayne H. Miller (Los Altos, CA), Ichiang Sun (Portland, OR)
Primary Examiner: Antoine D. Davis
Attorney: Smith-Hill and Bedell
Application Number: 29/201,978
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80)