Projector
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Description
The broken lines in the
Claims
The ornamental design for a projector, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
D449060 | October 9, 2001 | Saeki et al. |
D450076 | November 6, 2001 | Fujimaki |
D464074 | October 8, 2002 | Miyazaki |
D470525 | February 18, 2003 | Nakayama et al. |
D472570 | April 1, 2003 | Takahashi |
D474799 | May 20, 2003 | Kawasaki et al. |
D475389 | June 3, 2003 | Kurokawa |
D479261 | September 2, 2003 | Kawasaki et al. |
6616282 | September 9, 2003 | Ozawa |
6793346 | September 21, 2004 | Nakano et al. |
D498490 | November 16, 2004 | Kawasaki et al. |
D502486 | March 1, 2005 | Kawasaki et al. |
D505440 | May 24, 2005 | Kawasaki et al. |
20020048001 | April 25, 2002 | Fujimori |
1010459 | March 1998 | JP |
1010484 | March 1998 | JP |
1072526 | March 2000 | JP |
1072527 | March 2000 | JP |
1081587 | May 2000 | JP |
1201237 | February 2004 | JP |
1220158 | September 2004 | JP |
1239431 | March 2005 | JP |
1239447 | March 2005 | JP |
2005-014263 | May 2005 | JP |
2005-014274 | May 2005 | JP |
2005-015361 | May 2005 | JP |
Patent History
Patent number: D552656
Type: Grant
Filed: Sep 14, 2005
Date of Patent: Oct 9, 2007
Assignee: NEC Display Solutions, Ltd. (Tokyo)
Inventors: Yukihiko Oota (Tokyo), Junsi Lee (Tokyo), Kosuke Ito (Tokyo), Naoto Fukasawa (Tokyo)
Primary Examiner: Adir Aronovich
Assistant Examiner: Wan Laymon
Attorney: Seyfarth Shaw LLP
Application Number: 29/238,305
Type: Grant
Filed: Sep 14, 2005
Date of Patent: Oct 9, 2007
Assignee: NEC Display Solutions, Ltd. (Tokyo)
Inventors: Yukihiko Oota (Tokyo), Junsi Lee (Tokyo), Kosuke Ito (Tokyo), Naoto Fukasawa (Tokyo)
Primary Examiner: Adir Aronovich
Assistant Examiner: Wan Laymon
Attorney: Seyfarth Shaw LLP
Application Number: 29/238,305
Classifications