Stress meter
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Description
Claims
The ornamental design for a stress meter, as shown and described.
Referenced Cited
Patent History
Patent number: D567125
Type: Grant
Filed: Apr 27, 2006
Date of Patent: Apr 22, 2008
Assignee: Nipro Corporation (Osaka-Shi)
Inventors: Norio Okabe (Osaka), Hiroshi Yoshida (Osaka), Naohiro Atsumi (Osaka)
Primary Examiner: Antoine D. Davis
Attorney: Birch, Stewart, Kolasch & Birch, LLP
Application Number: 29/258,755
Type: Grant
Filed: Apr 27, 2006
Date of Patent: Apr 22, 2008
Assignee: Nipro Corporation (Osaka-Shi)
Inventors: Norio Okabe (Osaka), Hiroshi Yoshida (Osaka), Naohiro Atsumi (Osaka)
Primary Examiner: Antoine D. Davis
Attorney: Birch, Stewart, Kolasch & Birch, LLP
Application Number: 29/258,755
Classifications