Stress meter

- Nipro Corporation
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Description

FIG. 1 is a perspective view of a stress meter;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

Claims

The ornamental design for a stress meter, as shown and described.

Referenced Cited
U.S. Patent Documents
D309867 August 14, 1990 Johnson
D318245 July 16, 1991 Sierra et al.
D418134 December 28, 1999 Crump
D459811 July 2, 2002 Maus et al.
7183069 February 27, 2007 Yamaguchi et al.
Patent History
Patent number: D567125
Type: Grant
Filed: Apr 27, 2006
Date of Patent: Apr 22, 2008
Assignee: Nipro Corporation (Osaka-Shi)
Inventors: Norio Okabe (Osaka), Hiroshi Yoshida (Osaka), Naohiro Atsumi (Osaka)
Primary Examiner: Antoine D. Davis
Attorney: Birch, Stewart, Kolasch & Birch, LLP
Application Number: 29/258,755