Microscope
Latest Leica Microsystems (Schweiz) AG Patents:
Description
The broken lines are for illustrative purposes only and form no part of the claimed design.
Claims
The ornamental design for a microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
D439258 | March 20, 2001 | Kawahata |
D440996 | April 24, 2001 | Takanashi |
6337766 | January 8, 2002 | Fujino |
D459744 | July 2, 2002 | Apotheloz |
D460096 | July 9, 2002 | Apotheloz |
D460772 | July 23, 2002 | Apotheloz |
D461201 | August 6, 2002 | Apotheloz |
D465799 | November 19, 2002 | Asaka et al. |
D498247 | November 9, 2004 | Suzuki et al. |
D525636 | July 25, 2006 | Apotheloz |
D540835 | April 17, 2007 | Apothéloz |
D546355 | July 10, 2007 | Apotheloz |
D546356 | July 10, 2007 | Apotheloz |
000388822-0002 | October 2005 | EM |
1276856 | July 2006 | JP |
Patent History
Patent number: D577047
Type: Grant
Filed: Jul 31, 2007
Date of Patent: Sep 16, 2008
Assignee: Leica Microsystems (Schweiz) AG (Heerbrugg)
Inventor: Christophe Apothéloz (Zurich)
Primary Examiner: Paula A Greene
Attorney: Crowell & Moring LLP
Application Number: 29/287,376
Type: Grant
Filed: Jul 31, 2007
Date of Patent: Sep 16, 2008
Assignee: Leica Microsystems (Schweiz) AG (Heerbrugg)
Inventor: Christophe Apothéloz (Zurich)
Primary Examiner: Paula A Greene
Attorney: Crowell & Moring LLP
Application Number: 29/287,376
Classifications
Current U.S. Class:
Microscope (D16/131)