Micrometer

- Mitutoyo Corporation
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Description

FIG. 1 is a front view of a micrometer;

FIG. 2 is a rear view thereof;

FIG. 3 is a top view thereof; and,

FIG. 4 is a bottom view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for a micrometer, as shown and described.

Referenced Cited
U.S. Patent Documents
764106 July 1904 Turner
886817 May 1908 Kelley
1760372 May 1930 Pehrsson
3046666 July 1962 Mesich
3151482 October 1964 Forrester et al.
5317809 June 7, 1994 Kipnes
5383286 January 24, 1995 Kipnes
5691646 November 25, 1997 Sasaki
D391180 February 24, 1998 Thomas
Patent History
Patent number: D584177
Type: Grant
Filed: Apr 15, 2008
Date of Patent: Jan 6, 2009
Assignee: Mitutoyo Corporation (Kawasaki)
Inventors: Shigeru Ohtani (Kawasaki), Shuji Hayashida (Kawasaki), Yuji Fujikawa (Kure), Masahiko Tachikake (Kure)
Primary Examiner: Antoine D Davis
Attorney: Oliff & Berridge, PLC
Application Number: 29/300,594
Classifications